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PDF) Concurrent Self-Test with Partially Specified Patterns For Low Test Latency and Overhead
PDF) Delay-Insensitive Cell Matrix.
PDF) A Context-Aware Meeting Room: Mobile Interaction and Collaboration Using Android, Java ME and Windows Mobile
PDF) UHF Receiver Front-End: Implementation and Analog Baseband Design Considerations
NiDS2022 (Novel & Intelligent Digital Systems) - ATHENS
PDF) A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences
PDF) Survival analysis for modeling critical events that communities may undergo in dynamic social networks
PDF) Extending Internet into Space – ESA DTN Testbed Implementation and Evaluation
PDF) Detection of Delay Faults in Memory Address Decoders
Education and Information Technologies | Home
PDF) A domain-specific approach for software development on Manycore platforms
PDF) A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences
IVML > People > Phivos Mylonas
PDF) Modeling and Simulation of Efficient March Algorithm for Memory Testing
PDF) A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences
PDF) A Closed-Loop Approach for Improving the Wellness of Low-Income Elders at Home Using Game Consoles
PDF) On the generation of pseudo-deterministic two-patterns test sequence with LFSRs.
PDF) Test pattern generation based on arithmetic operations
PDF) Memory testing with a RISC microcontroller
Education and Information Technologies | Home
Education and Information Technologies | Home
PDF) On the Generation of Functional Test Programs for the Cache Replacement Logic
PDF) Multimode scan: Test per clock BIST for IP cores
PDF) Symmetry Measure for Memory Test and Its Application in BIST Optimization
PDF) Accumulator-Based Weighted Pattern Generation.
PDF) Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique
PDF) Test Embedding with Discrete Logarithms
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Steffen Tarnick's research works | Universität Potsdam, Potsdam and other places
PDF) Pseudorandom, Weighted Random and Pseudoexhaustive Test Patterns Generated in Universal Cellular Automata
PDF) New Algorithms for Address Decoder Delay Faults and Bit Line Imbalance Faults
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